TTEP 2013 Call for Tutorial Proposals
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TTEP 2013

TEST TECHNOLOGY
EDUCATIONAL PROGRAM 2013

http://tab.computer.org/tttc/teg

CALL FOR TUTORIAL PROPOSALS

Overview

The Tutorials & Education Group (TEG) of the IEEE Computer Society Test Technology Technical Council (TTTC) organizes in 2013 a comprehensive set of Test Technology Tutorials to be held in conjunction with TTTC sponsored technical meetings. The objective of this common call is to invite submissions for tutorial proposals in order to enable selecting the best fitted tutorials for each technical meeting, as part of the annual Test Technology Educational Program (TTEP).

The tutorials accepted by the Program Committee will be included in the Test Technology Educational Program, the intent of which is to serve the test and design professionals offering fundamental education and expert knowledge in state-of-the-art test technology topics.

Participation in TTEP-organized tutorials is accredited by IEEE Computer Society. Each full day tutorial corresponds to four TTEP units (half day tutorial corresponds to two TTEP units). Upon completion of every sixteen units official accreditation in the form of the “IEEE TTTC Test Technology Certificate” is presented to the participants.

The TTEP 2013 tutorials program includes (but is not limited to) the following technical meetings:

  • Latin American Test Workshop (LATW’13), April 2–5, Cordoba, Argentina
  • VLSI Test Symposium (VTS’13), April 29–May 2, Berkeley, California, USA
  • Signal Propagation on Interconnects Workshop (SPI’13), May 12-15, Paris, France
  • International Test Conference (ITC’13), September 10-12, Anaheim, California, USA
  • Asian Test Symposium (ATS’13), November 18-22, Jiaosi, Yilan, Taiwan

TTEP accommodates a wide range of technical areas, from mature test topics of high interest to industrial test engineers to emerging test topics with emphasis on novelty. TTEP is soliciting new and updated tutorial proposals, as well as proposals for Test Clinics, which are particularly geared towards newcomers to the area of test, such as new test engineers and students pursuing graduate studies in test, with an objective of offering a broad yet comprehensive review of basic test topics in an accessible way to the lay audience (to be offered at ITC’13). The topics of interest for year 2013 TTEP Tutorials include (but are not limited to):

  • 3D chip testing
  • Automatic test equipment
  • Board-level testing
  • Built-In Self-Test
  • Defect oriented testing
  • Design for testability
  • DFT testers
  • Diagnosis and debug
  • Embedded core testing
  • Hardware Security
  • High-speed interface testing
  • Interconnect characterzation
  • Memory testing
  • Mixed-Signal/Analog testing
  • Nanometer tech testing
  • On-line and field testing
  • Performance/Delay testing
  • Microprocessor testing
  • Power issues in testing
  • System-level testing
  • Test economics
  • Test synthesis
  • Test resource partitioning
  • Test related standards
  • Verification and Validation
  • Wafer testing
  • Yield optimization and test

Author Information

All tutorial proposal submissions to TTEP 2013 are to be made electronically (in PDF format using the TTEP tutorial proposal template provided on both the TTEP main web site and the submission website) through the TTEP submissions website:

January 30, 2013: Deadline for tutorial proposals
February 20, 2013: Notification of acceptance for LATW’13, VTS’13, SPI’13.
April 25, 2013: Notification of acceptance for ITC’13.
August 24, 2013: Notification of acceptance for ATS’13.

Contact Information:

Cecilia Metra
TTEP Chair
University of Bologna, Italy
T: +39 051 2093038
F: +39 051 2093073
E: cecilia.metra@unibo.it
Paolo Bernardi
TTEP Vice Chair (Program)
Politecnico di Torino
T: +39 011 564 7183
F: +39 011 564 7099
E: paolo.bernardi@polito.it
 

TTEP central web site:http://tab.computer.org/tttc/teg

TTEP web site for submissions: http://tab.computer.org/tttc/teg/submission.html

Tutorials and Education Group

Tutorials and Education Group Chair
Cecilia Metra
University of Bologna

Vice Chair (Program)
Paolo Bernardi
Politecnico di Torino

For more information, visit us on the web at: http://tab.computer.org/tttc/teg

The Test Technology Educational Program 2013 (TTEP 2013) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).


IEEE Computer Society- Test Technology Technical Council

TTTC CHAIR
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

PAST CHAIR
Adit D. SINGH
Auburn University - USA
Tel. +1-334-844-1847
E-mail adsingh@eng.auburn.edu

TTTC 1ST VICE CHAIR
Cecilia METRA
Università di Bologna - Italy
Tel. +39-051-209-3038
E-mail cmetra@deis.unibo.it

SECRETARY
Joan FIGUERAS
UPC Barcelona Tech - Spain
Tel. +
E-mail figueras@eel.upc.edu

ITC GENERAL CHAIR
Doug YOUNG
BVC Industrial - USA
Tel. +1-602-617-0393
E-mail doug0037@aol.com

TEST WEEK COORDINATOR
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com

TUTORIALS AND EDUCATION
Dimitris GIZOPOULOS

University of Athens
- Greece
Tel. +30-210-7275145
E-mail dgizop@di.uoa.gr

STANDARDS
Rohit KAPUR

Synopsys
, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

EUROPE
Matteo SONZA REORDA
Politecnico di Torino - Italy
Tel.+39-011-564-7055
E-mail matteo.sonzareorda@polito.it

MIDDLE EAST & AFRICA
Ibrahim HAJJ
American University of Beirut - Lebanon
Tel. +961-1-341-952
E-mail ihajj@aub.edu.lb

STANDING COMMITTEES
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

ELECTRONIC MEDIA
Giorgio DI NATALE
LIRMM - France
Tel. +33-4-6741-8501
E-mail giorgio.dinatale@lirmm.fr

PRESIDENT OF BOARD
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com

SENIOR PAST CHAIR
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

TTTC 2ND VICE CHAIR
Rohit KAPUR
Synopsys
, Inc. - USA
Tel. +1-650-934-1487
E-mail rkapur@synopsys.com

FINANCE
Michael NICOLAIDIS
TIMA Laboratory - France
Tel. +33-4-765-74696
E-mail michael.nicolaidis@imag.fr

IEEE DESIGN & TEST EIC
Krish CHAKRABARTY
Duke University - USA
Tel. +1-
E-mail krish@ee.duke.edu

TECHNICAL MEETINGS
Chen-Huan CHIANG
Alcatel-Lucent
- USA
Tel. +1-973-386-6759
E-mail chen-huan.chiang@alcatel-lucent.com

TECHNICAL ACTIVITIES
Patrick GIRARD
LIRMM – France
Tel.+33 467 418 629
E-mail patrick.girard@lirmm.fr

ASIA & PACIFIC
Kazumi HATAYAMA
NAIST - Japan
Tel. +81 743 72 5221
E-mail k-hatayama@is.naist.jp

LATIN AMERICA
Victor Hugo CHAMPAC
Instituto Nacional de Astrofisica - Mexico
Tel.+52-22-470-517
E-mail champac@inaoep.mx

NORTH AMERICA
André IVANOV
University of British Columbia - Canada
Tel. +1-604-822-6936
E-mail ivanov@ece.ubc.ca

COMMUNICATIONS
Cecilia METRA
Università di Bologna - Italy
Tel. +39-051-209-3038
E-mail cmetra@deis.unibo.it

INDUSTRY ADVISORY BOARD
Yervant ZORIAN
Synopsys, Inc.- USA
Tel. +1-650-584-7120
E-mail Yervant.Zorian@synopsys.com